Measurement of Microwave Diffraction from a Long Slit in a Thin Conducting Plane
作者:
Jay L. Hirshfield,
Clayton M. Zieman,
期刊:
Journal of Applied Physics
(AIP Available online 1955)
卷期:
Volume 26,
issue 2
页码: 135-137
ISSN:0021-8979
年代: 1955
DOI:10.1063/1.1721951
出版商: AIP
数据来源: AIP
摘要:
This paper gives the results of measurements of the fields diffracted from a long narrow slit in a large conducting plane, when a uniform plane is incident. The results for two polarizations are shown.
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