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The Average Sample Number for Truncated Double Sample Attribute Plans

 

作者: WilliamC. Guenther,  

 

期刊: Technometrics  （Taylor Available online 1971）
卷期: Volume 13, issue 4  

页码: 811-816

 

ISSN:0040-1706

 

年代: 1971

 

DOI:10.1080/00401706.1971.10488851

 

出版商: Taylor & Francis Group

 

数据来源: Taylor

 

摘要:

Craig [1] has given a formula for computing the ASN when binomial double sampling is terminated if too many defectives are found in either sample. An alternative form of that result more adaptable to use with tables is given together with the companion result for the hypergeometric case.

 

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