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Characterization of planar local arrangement by means of the Delaunay neighbourhood

 

作者: M. Bertram,   H. Wendrock,  

 

期刊: Journal of Microscopy  （WILEY Available online 1996）
卷期: Volume 181, issue 1  

页码: 45-53

 

ISSN:0022-2720

 

年代: 1996

 

DOI:10.1046/j.1365-2818.1996.93374.x

 

出版商: Blackwell Science Ltd

 

关键词: Image analysis;Dirichlet tessellation;Delaunay triangulation;stochastic geometry;germ‐grain models;neighbourhood

 

数据来源: WILEY

 

摘要:

A suitable procedure is presented to characterize the neighbourhood in disperse micro‐structures by measuring the Delaunay neighbour distances and neighbour numbers. Results are discussed from simulation experiments with three germ‐grain models, regular arrangements and a seam‐like model. A plot of variation coefficients is suggested to differentiate between various random distributions of part

 

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