Accuracy of defect densities measured by the constant photocurrent method
作者:
N. W. Wang,
X. Xu,
S. Wagner,
期刊:
AIP Conference Proceedings
(AIP Available online 1991)
卷期:
Volume 234,
issue 1
页码: 186-194
ISSN:0094-243X
年代: 1991
DOI:10.1063/1.41027
出版商: AIP
数据来源: AIP
摘要:
We report a study of the accuracy with which the Urbach energy and defect density of a‐Si:H and a‐Si,Ge:H alloys may be extracted from optical absorption spectra determined by the constant photocurrent method. Surprisingly, a great part of the discrepancy results from evaluation of the CPM spectra, rather than from the normalization of the spectra to an absolute scale of the optical absorption coefficient. We will discuss the sources of error in several existing methods of data analysis and the adaptability of these methods for studying alloys. As well, we propose a new method of analysis, one in which we look at the excess subgap absorption over a range of energies.
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