首页   按字顺浏览 期刊浏览 卷期浏览 Accuracy of defect densities measured by the constant photocurrent method
Accuracy of defect densities measured by the constant photocurrent method

 

作者: N. W. Wang,   X. Xu,   S. Wagner,  

 

期刊: AIP Conference Proceedings  (AIP Available online 1991)
卷期: Volume 234, issue 1  

页码: 186-194

 

ISSN:0094-243X

 

年代: 1991

 

DOI:10.1063/1.41027

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We report a study of the accuracy with which the Urbach energy and defect density of a‐Si:H and a‐Si,Ge:H alloys may be extracted from optical absorption spectra determined by the constant photocurrent method. Surprisingly, a great part of the discrepancy results from evaluation of the CPM spectra, rather than from the normalization of the spectra to an absolute scale of the optical absorption coefficient. We will discuss the sources of error in several existing methods of data analysis and the adaptability of these methods for studying alloys. As well, we propose a new method of analysis, one in which we look at the excess subgap absorption over a range of energies.

 

点击下载:  PDF (409KB)



返 回