Photoluminescence and photoconductivity of Si- and Ge-rich SiGe bulk crystals
作者:
M. Franz,
K. Pressel,
A. Barz,
P. Dold,
K. W. Benz,
期刊:
Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
(AIP Available online 1998)
卷期:
Volume 16,
issue 3
页码: 1717-1720
ISSN:1071-1023
年代: 1998
DOI:10.1116/1.590041
出版商: American Vacuum Society
关键词: (Si,Ge)
数据来源: AIP
摘要:
We have investigated Si-(0⩽x⩽0.13)and Ge-rich(0.90⩽x⩽1)Si1−xGexbulk crystals by photoluminescence and photoconductivity measurements. The small linewidths of the near band edge luminescence of less than 4 meV demonstrate the high quality of the crystals. Luminescence linewidth, line shape, and intensity ratios of transitions with and without phonon participation reveal a stronger influence of alloy effects on excitons on the Ge-rich side compared with the Si-rich side. Photoconductivity spectra of boron doped Si-rich and phosphorus doped Ge-richSi1−xGexcrystals show the influence of alloy composition and alloy fluctuations on the impurity levels. The shift of the photoconductivity spectra with increasing Si or Ge concentration indicates the change of the ground state energy of the impurity with changing alloy composition.
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