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Investigations on calibration sources for soft‐x‐ray plasma spectroscopy and impurity monitors

 

作者: U. Schumacher,   K. Asmussen,   G. Fussmann,   T. Liebsch,   R. Neu,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1996)
卷期: Volume 67, issue 8  

页码: 2826-2830

 

ISSN:0034-6748

 

年代: 1996

 

DOI:10.1063/1.1147112

 

出版商: AIP

 

数据来源: AIP

 

摘要:

For absolute soft‐x‐ray line intensity measurements to deduce elemental concentrations and parameters of magnetically confined plasmas large‐area x‐ray sources are developed and investigated. These calibration sources useK,L, andMtransitions in different elements and cover a wide photon energy (and wavelength) range. From the measured absolute line intensities of these sources the quantum efficiency values of numerous elements forK‐,L‐, andM‐line emission per incident electron are deduced. They represent the basis of simple soft‐x‐ray monitors for impurities in fusion plasmas. ©1996 American Institute of Physics.

 

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