Investigations on calibration sources for soft‐x‐ray plasma spectroscopy and impurity monitors
作者:
U. Schumacher,
K. Asmussen,
G. Fussmann,
T. Liebsch,
R. Neu,
期刊:
Review of Scientific Instruments
(AIP Available online 1996)
卷期:
Volume 67,
issue 8
页码: 2826-2830
ISSN:0034-6748
年代: 1996
DOI:10.1063/1.1147112
出版商: AIP
数据来源: AIP
摘要:
For absolute soft‐x‐ray line intensity measurements to deduce elemental concentrations and parameters of magnetically confined plasmas large‐area x‐ray sources are developed and investigated. These calibration sources useK,L, andMtransitions in different elements and cover a wide photon energy (and wavelength) range. From the measured absolute line intensities of these sources the quantum efficiency values of numerous elements forK‐,L‐, andM‐line emission per incident electron are deduced. They represent the basis of simple soft‐x‐ray monitors for impurities in fusion plasmas. ©1996 American Institute of Physics.
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