Tensile Testing Technique for Submicron Specimens
作者:
F. D. Lemkey,
R. W. Kraft,
期刊:
Review of Scientific Instruments
(AIP Available online 1962)
卷期:
Volume 33,
issue 8
页码: 846-849
ISSN:0034-6748
年代: 1962
DOI:10.1063/1.1717988
出版商: AIP
数据来源: AIP
摘要:
A tensile testing instrument of the soft type which has been specifically designed to facilitate accurate axial alignment of submicron whiskers or filaments is described. The load is applied by a dead‐weight loading mechanism similar to that used in chain balances and strain is measured photographically. The limiting feature on the accuracy of the results is the diameter variation which occurs within individual whiskers rather than the instrument. Tensile data are presented for a 0.35‐&mgr;‐diam Cr fiber extracted from a unidirectionally solidified ingot of Cu‐Cr eutectic alloy.
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