Electrostatic TEM studies of twisted domains in thin iron films
作者:
H. Karamon,
G. F. Rempfer,
J. Dash,
M. Takeo,
期刊:
Journal of Applied Physics
(AIP Available online 1982)
卷期:
Volume 53,
issue 3
页码: 2774-2776
ISSN:0021-8979
年代: 1982
DOI:10.1063/1.330963
出版商: AIP
数据来源: AIP
摘要:
The Lorentz and Foucault methods have been used to study twisted domains in thin (∼200 A˚) iron films (made by evaporation) in an electrostatic transmission electron microscope (TEM). Twisted domains have been observed to occur spontaneously, as well as during and after the application of an in‐plane magnetic field. We have found that twisted domains consist of alternate sections separated by roughly 90° domain walls. Between these sections and the surrounding domain the wall is alternately 90° and 180°. The ripple structure in the micrographs provides further evidence as to the directions of magnetization. When Blochline‐crosstie pairs are present, they occur on the 180° walls but not on the 90° walls.
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