Switched remanent polarization was measured as a function of accumulated switching cycles for a variety of ferroelectric films using sinusoidally driven hysteresis loops. Switched remanent polarization and dielectric constant and loss were also obtained as a function of the cycling frequency. PZT films with niobium additives appeared to lose switched remanent polarization with accumulated cycles at a lesser rate than films without niobium. The switched remanent polarization was found to decrease with increasing frequency, which we attribute to the effect of grain size. Also, a decrease of dielectric constant with increasing frequency and an increase of dielectric constant with increased applied voltage are attributed to the effects of domain wall motion contributions to dielectric constant.