Field dependence of critical currents in polycrystalline Bi‐Pb‐Sr‐Ca‐Cu‐O superconductors
作者:
S. Jin,
T. H. Tiefel,
R. B. van Dover,
J. E. Graebner,
T. Siegrist,
G. W. Kammlott,
R. A. Fastnacht,
期刊:
Applied Physics Letters
(AIP Available online 1991)
卷期:
Volume 59,
issue 3
页码: 366-368
ISSN:0003-6951
年代: 1991
DOI:10.1063/1.105597
出版商: AIP
数据来源: AIP
摘要:
The field dependence ofJcin partial‐melt‐processed Bi1.6Pb0.3Sb0.1Sr2Ca2Cu3Oxhas been investigated. The samples have a dense, polycrystalline microstructure of the (2223) phase with no significant crystallographic texture, and exhibitTc(&khgr;)∼105 K and transportJc(H=0)∼104A/cm2at 4.2 K. In high magnetic fields (e.g.,H=5 T), the transportJcis somewhat reduced but is still of substantial value. While the high‐angle grain boundaries in the present, partial‐melt‐processed samples are by no means weakly coupled, the field dependence of the critical current density [Jc(0)/Jc(5 T)∼10] is somewhat stronger than inc‐axis textured samples [Jc(0)/Jc(5 T)∼3]. The grain boundaries in the present polycrystalline samples may thus be viewed, on the average, as ‘‘mild’’ weak links. These results clearly indicate the necessity for grain texturing if the fullJccapability of the BSCCO‐type superconductors is to be exploited.
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