Thin‐film induced stress in GaAs ridge‐waveguide structures integrated with sputter‐deposited ZnO films
作者:
Hong Koo Kim,
Walter Kleemeier,
Yabo Li,
Dietrich W. Langer,
Daniel T. Cassidy,
Douglas M. Bruce,
期刊:
Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
(AIP Available online 1994)
卷期:
Volume 12,
issue 3
页码: 1328-1332
ISSN:1071-1023
年代: 1994
DOI:10.1116/1.587295
出版商: American Vacuum Society
关键词: OPTOELECTRONIC DEVICES;WAVEGUIDES;GALLIUM ARSENIDES;ZINC OXIDES;SILICON OXIDES;THIN FILMS;HETEROSTRUCTURES;STRESSES;SPUTTERING;PHOTOLUMINESCENCE;HEAT TREATMENTS;ZnO;SiO2;GaAs
数据来源: AIP
摘要:
ZnO films were deposited on a GaAs ridge structure using radio‐frequency (rf)‐magnetron sputtering. A SiO2thin buffer layer was introduced to alleviate a thermal mismatching problem between the ZnO film and the GaAs substrate. Deposition parameters such as rf power, distance, and gas composition/pressure were optimized to obtain highlyc‐axis oriented and highly resistive ZnO films. Postdeposition anneal treatment at 430 °C for 5–10 min was found to enhancec‐axis orientation of the ZnO films dramatically and to reduce intrinsic stress significantly. Stress on the cleaved facet of the waveguide was imaged with a spatially resolved and polarization‐resolved photoluminescence technique. The results showed that the GaAs mesa is stressed up to 1×109dyn/cm2(10−3strain) due to residual stress from the ZnO/SiO2/GaAs structure.
点击下载:
PDF
(456KB)
返 回