首页   按字顺浏览 期刊浏览 卷期浏览 ELECTROMAGNETIC TOPOLOGY: MEASUREMENTS AND NORMS OF SCATTERING PARAMETERS OF SUBSHIELDS
ELECTROMAGNETIC TOPOLOGY: MEASUREMENTS AND NORMS OF SCATTERING PARAMETERS OF SUBSHIELDS

 

作者: F. C. Yang Dikewood,   C. E. Baum,  

 

期刊: Electromagnetics  (Taylor Available online 1986)
卷期: Volume 6, issue 1  

页码: 47-59

 

ISSN:0272-6343

 

年代: 1986

 

DOI:10.1080/02726348608915199

 

出版商: Taylor & Francis Group

 

数据来源: Taylor

 

摘要:

Scattering matrices of subshields and their norms have been used to relate the internal signals of an enclosed volume to an electromagnetic source environment. Both the line and aperture penetrations are included in the scattering matrix formulation. Experimental and analytical methods are proposed for the determination of the elements of the scattering matrices corresponding to these penetrations. These methods can, in turn, be used to analyze the overall shielding performance and to allocate the subshield electromagnetic hardening requirements of a system. Limitations and assumptions in using this electromagnetic topology technique are also addressed.

 

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