Sequential Designs for Replacements in Exponential Life Tests
作者:
AlanJ. Izenman,
Yosef Rinott,
期刊:
Technometrics
(Taylor Available online 1977)
卷期:
Volume 19,
issue 4
页码: 455-459
ISSN:0040-1706
年代: 1977
DOI:10.1080/00401706.1977.10489585
出版商: Taylor & Francis Group
关键词: Exponential Distribution;Fully-Sequential Replacement Procedure;Two-Stage Replacement Procedure;Censored Data
数据来源: Taylor
摘要:
In certain exponential life-testing models, the optimal number of replacements is a function of the unknown parameter which is being estimated. Two procedures are proposed in this paper to overcome this dificulty by sequentially estimating the parameter and redesigning the experiment in a model similar to that considered by Blight [1]. Monte Carlo studies indicate that such an approach yields results which are almost as good as the optimal design which depends on the unknown parameter. Life-test data on semiconductor devices is used for the purpose of illustrating the proposed procedures.
点击下载:
PDF (476KB)
返 回