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Thermal fluctuation and 1/fnoise in oriented and unoriented Y1Ba2Cu3O7−xfilms

 

作者: R. D. Black,   L. G. Turner,   A. Mogro‐Campero,   T. C. McGee,   A. L. Robinson,  

 

期刊: Applied Physics Letters  （AIP Available online 1989）
卷期: Volume 55, issue 21  

页码: 2233-2235

 

ISSN:0003-6951

 

年代: 1989

 

DOI:10.1063/1.102355

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We report on electrical noise measurements made on YBCO (Y1Ba2Cu3O7−x) films on SrTiO3, on bulk silicon with a ZrO2buffer layer, and on thin dielectric membranes. We have found that 1/fnoise predominates in the unoriented films and that thermal fluctuation noise is the chief source of noise in good films on SrTiO3.

 

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