Near‐field probes have been developed, based on standard, i.e., commercially available, Si cantilever probes for scanning force microscopy (SFM), which directly convert the optical near‐field signal into an electrical signal using Schottky contacts. With these optoelectronic probes it is possible to realize very compact near‐field microscopes. The probes are inserted into a SFM and measure the topography and the optical near‐field signal simultaneously. The qualitative analysis of the light‐sensitive areas of the probes and the detection of the optical near field is described. Finally, subwavelength resolution is demonstrated when a polished glass surface is investigated. ©1995 American Institute of Physics.