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Optimal adjustment strategies for a process with run-to-run variation and 0–1 quality loss

 

作者: PASQUALE SULLO,   MARK VANDEVEN,  

 

期刊: IIE Transactions  (Taylor Available online 1999)
卷期: Volume 31, issue 12  

页码: 1135-1145

 

ISSN:0740-817X

 

年代: 1999

 

DOI:10.1080/07408179908969914

 

出版商: Taylor & Francis Group

 

数据来源: Taylor

 

摘要:

As short run manufacturing becomes more prevalent, run-to-run components of variation, such as that contributed by set-up error, have greater potential to crucially affect product quality. While efforts should be made to eliminate such between-run variance contributing factors, some will always be present. Here, we assume there is one such factor which we envisage as set-up error that, unless the process is adjusted, remains fixed throughout a run. We develop a single adjustment strategy based on taking a sample of fixed size from the process. If a significant set-up error is indicated, a single compensatory adjustment, equal to the predicted process offset, is executed. The actual procedure depends on process parameters, including adjustment error, run size, and adjustment and sampling costs. The procedure not only specifies the adjustment amount, if any, but the time during the run at which to adjust. The procedure is, optimal among all fixed sample size procedures for the chosen cost function. Besides incorporating adjustment and sampling costs, the cost function is based on a 0–1 loss criterion, where the loss is 0 (1) units per item produced if the process offset caused by set-up error is less than or equal to (greater than) a specified amount. Tables are provided, with examples, illustrating the procedure for representative values of process parameters, costs, and run sizes.

 

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