A streaked multiple pinhole camera technique, first used by P. Choi and co‐workers [C. Deeney and P. Choi, Rev. Sci. Instrum.60, 3558 (1989); P. Choi and R. Aliaga,ibid.61, 2747 (1990)] to record time‐ and two‐dimensional space‐resolved soft x‐ray images of plasma pinches, has been implemented on laser plasmas at NOVA. The instrument is particularly useful for time‐resolved imaging of small sources (<150 &mgr;m in size) such as implosions for which the necessary alignment accuracy is relaxed from ≤10 &mgr;m for a single pinhole, to 200 &mgr;m for a nine‐pinhole column. Results at 20 &mgr;m, 30‐ps resolution are presented for ≳2.5‐keV imaging, complementing the existing 1–3‐keV streaked x‐ray microscope capabilities at NOVA.