Atomic level stress and light emission of Ce activated SrS thin films
作者:
W. L. Warren,
K. Vanheusden,
D. R. Tallant,
C. H. Seager,
S.-S. Sun,
D. R. Evans,
W. M. Dennis,
Erkki Soininen,
J. A. Bullington,
期刊:
Journal of Applied Physics
(AIP Available online 1997)
卷期:
Volume 82,
issue 4
页码: 1812-1814
ISSN:0021-8979
年代: 1997
DOI:10.1063/1.366284
出版商: AIP
数据来源: AIP
摘要:
We find that theCe3+ion in polycrystalline sputtered SrS:Ce thin films resides in a distorted octahedral environment, as opposed to the cubic host environment. Using electron paramagnetic resonance and x-ray diffraction analysis, we show that the degree of axial distortion is related to the preferential growth direction of the SrS films. To first order, the blue-emission properties (emission wavelength and decay times) of the SrS:Ce films do not appear to be affected by the amount of distortion in the localCe3+environment. ©1997 American Institute of Physics.
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