Calibration of scanning tunneling microscope transducers using optical beam deflection
作者:
G. C. Wetsel,
S. E. McBride,
R. J. Warmack,
B. Van de Sande,
期刊:
Applied Physics Letters
(AIP Available online 1989)
卷期:
Volume 55,
issue 6
页码: 528-530
ISSN:0003-6951
年代: 1989
DOI:10.1063/1.101868
出版商: AIP
数据来源: AIP
摘要:
An accurate, sensitive, easily implemented method of calibration of the elastic displacement of piezoelectric transducers used in scanning tunneling microscopes has been developed. The axial displacement for both static and harmonic excitation has been measured using laser beam deflection amplified by an optical magnification system. For harmonic excitation where lock‐in amplifier detection can be utilized, displacements as small as 0.03 A˚ have been measured. Measurements on PZT‐5H and PZT‐8 transducers over a range of five orders of magnitude in applied voltage demonstrate the power of the method in calibration of displacements from the subangstrom to the nonlinear region with an uncertainty of about 4%.
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