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Direct Charge Transfer by X Irradiation in the System CaF2:Eu, Tm

 

作者: Benjamin Welber,  

 

期刊: Journal of Applied Physics  (AIP Available online 1965)
卷期: Volume 36, issue 9  

页码: 2744-2745

 

ISSN:0021-8979

 

年代: 1965

 

DOI:10.1063/1.1714572

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Starting with CaF2containing Eu2+and Tm3+ions, we have employed optical techniques to observe the decrease in valence of the Tm ion under x irradiation. We find that the number of Tm2+ions produced corresponds closely to the number of Eu2+ions which disappear, and we suggest that the underlying mechanism is a direct transfer of an electron between the two types of ions.

 

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