Ion‐assisted etching of Si with Cl2: The effect of flux ratio
作者:
J. W. Coburn,
期刊:
Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
(AIP Available online 1994)
卷期:
Volume 12,
issue 3
页码: 1384-1389
ISSN:1071-1023
年代: 1994
DOI:10.1116/1.587303
出版商: American Vacuum Society
关键词: SILICON;ETCHING;ARGON IONS;ION BEAMS;KEV RANGE 01−10;CHLORINE MOLECULES;CHEMICAL REACTIONS;MASS SPECTRA;ION FLUX;SURFACE COLLISIONS;Si
数据来源: AIP
摘要:
The room‐temperature ion‐assisted etching of poly‐Si with molecular chlorine and 1 keV Ar+ions has been studied for a wide range of the neutral flux/ion flux ratio.Insitumeasurements of the etch rate made using quartz crystal microbalance methods are combined with modulated beam mass spectrometric studies of the etch products and the unreacted molecular chlorine reflected from the Si surface. The reaction probability for the incident chlorine is determined in two independent ways and good agreement is obtained. The products are determined to be primarily SiCl2and SiCl4with significant amounts of sputtered SiCl at low flux ratios.
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