Optical imaging of carrier dynamics in silicon with subwavelength resolution
作者:
A. H. La Rosa,
B. I. Yakobson,
H. D. Hallen,
期刊:
Applied Physics Letters
(AIP Available online 1997)
卷期:
Volume 70,
issue 13
页码: 1656-1658
ISSN:0003-6951
年代: 1997
DOI:10.1063/1.118661
出版商: AIP
数据来源: AIP
摘要:
Characteristic rate variations of carrier processes are imaged using near-field scanning optical microscopy. We couple both a visible pump and an infrared probe light through a subwavelength aperture to investigate the interband recombination and intraband diffusion of excess carriers in oxidized silicon. Typical values of the locally measured life time constants agree well with those obtained by conventional space-averaged techniques. Moreover, the images locate defects, reveal variations, and can map the regions in which a recombination process is active. ©1997 American Institute of Physics.
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