Crystallization of rapid thermal processed PZT
作者:
E.M. Griswold,
L. Weaver,
D.S. McIntyre,
M. Sayer,
I.D. Calder,
期刊:
Integrated Ferroelectrics
(Taylor Available online 1995)
卷期:
Volume 10,
issue 1-4
页码: 123-130
ISSN:1058-4587
年代: 1995
DOI:10.1080/10584589508012270
出版商: Taylor & Francis Group
数据来源: Taylor
摘要:
The influence of substrate materials on the crystallization kinetics of thin film PZT is presented. Structure and orientation of electrodes affect the nucleation and growth processes of PZT as it transforms from pyrochlore to perovskite. These determine the final film structure and ferroelectric and dielectric properties. Rapid thermal processed sol gel PZT was fabricated on ruthenium oxide (RuO2) and on platinum electrodes. A study of oriented RuO2electrodes was carried out using glancing angle XRD and transmission electron microscopy (TEM). These techniques were used to assess types and locations of phases present in the films, grain size, crystal orientation and morphology.
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