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Surface oxidation of molten soft solder: An Auger study

 

作者: E. E. de Kluizenaar,  

 

期刊: Journal of Vacuum Science&Technology A: Vacuum, Surfaces, and Films  (AIP Available online 1983)
卷期: Volume 1, issue 3  

页码: 1480-1485

 

ISSN:0734-2101

 

年代: 1983

 

DOI:10.1116/1.572173

 

出版商: American Vacuum Society

 

关键词: oxides;oxidation;chemical composition;tin oxides;copper;nickel;tin;lead;soldering;contamination;aluminium;zinc;phosphorus;auger electron spectroscopy;lead alloys;tin alloys

 

数据来源: AIP

 

摘要:

The composition of oxide films, formed on stagnant, molten soft solder has been studied. The influence of oxidation time and of solder composition on the oxide films was measured. On clean soft solder SnPb60‐40 a complex oxide film was formed, consisting of a thin outer layer of SnO2, a layer of SnO mixed with metallic lead, and a transition layer to the underlying solder metal. The same type of oxide layer was formed on solder with copper or with nickel. On soft solder contaminated with aluminium, zinc, or phosphorus the contaminants were preferentially oxidized, resulting in an aluminium oxide film, a zinc oxide film, and a mixed phosphorus oxide–tin oxide film, respectively.

 

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