Structural properties of Ba0.6Sr0.4TiO3thin films on epitaxial RuO2electrodes
作者:
Q.X. Jia,
C. Kwon,
P. Lu,
期刊:
Integrated Ferroelectrics
(Taylor Available online 1999)
卷期:
Volume 24,
issue 1-4
页码: 57-63
ISSN:1058-4587
年代: 1999
DOI:10.1080/10584589908215578
出版商: Taylor & Francis Group
关键词: RuO2;Ba0.6Sr0.4TiO3;thin film deposition
数据来源: Taylor
摘要:
For the first time, we have demonstrated that epitaxial Ba0.6Sr0.4TiO3thin films can be grown on the epitaxial RuO2electrodes by pulsed laser ablation. The Ba0.6Sr0.4TiO3films, deposited on epitaxial (200) oriented RuO2grown on (100) yttria-stabilized zirconia, exhibit single out-of-plane orientation as well as in-plane alignments. The detailed epitaxial relationships between the Ba0.6Sr0.4TiO3films and the RuO2electrodes have been analyzed by X-ray diffraction and transmission electron microscopy.
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