High‐resolution scanning transmission electron microscope at Johns Hopkins
作者:
J. W. Wiggins,
J. A. Zubin,
M. Beer,
期刊:
Review of Scientific Instruments
(AIP Available online 1979)
卷期:
Volume 50,
issue 4
页码: 403-410
ISSN:0034-6748
年代: 1979
DOI:10.1063/1.1135840
出版商: AIP
数据来源: AIP
摘要:
The scanning transmission electron microscope constructed at Johns Hopkins follows the general layout of the first instrument at the University of Chicago. It is currently operating at 50 kV with a resolution of about 3 A˚. Its detector scheme consists of scintillation crystals coupled to photomultipliers in such a way as to eliminate introduction of unnecessary statistical noise. A unique alignment scheme utilizes the spherical aberration of the objective lens.
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