Damage of STM tips during nanofabrication
作者:
N. Yokoi,
S. Namba,
M. Takai,
期刊:
Advanced Materials for Optics and Electronics
(WILEY Available online 1993)
卷期:
Volume 2,
issue 1‐2
页码: 71-77
ISSN:1057-9257
年代: 1993
DOI:10.1002/amo.860020109
出版商: John Wiley&Sons Ltd.
关键词: Scanning tunnelling microscope (STM);Tip;HOPG;Nanofabrication;In situprocessing
数据来源: WILEY
摘要:
AbstractThe STM tip shape was found to change when nanofabrication using a scanning tunnelling microscope (STM) was attempted by applying voltage pulses between the tip and the sample. This change, which is considered to be caused by the voltage pulses, was studied systematically to investigate the thermal contribution to nanofabrication using STM tips. The tips become easily damaged as the pulse amplitude and pulse width increase or the tunnelling gap decreases. Thermal reaction, including thermochemical reaction, is considered to play an important role in such nanofabrication.
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