Optimization of the capacitance–voltage profiling method based on inverse modeling
作者:
K. Iniewski,
C. A. T. Salama,
期刊:
Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
(AIP Available online 1992)
卷期:
Volume 10,
issue 1
页码: 480-484
ISSN:1071-1023
年代: 1992
DOI:10.1116/1.586379
出版商: American Vacuum Society
关键词: DOPING PROFILES;ALGORITHMS;CV CHARACTERISTIC;POISSON EQUATION;COMPUTERIZED SIMULATION;CAPACITORS;ION IMPLANTATION;MOS JUNCTIONS
数据来源: AIP
摘要:
The doping profile in semiconductors can be extracted very accurately fromC–Vmeasurements using the inverse modeling approach. This method requires very extensive numerical calculations which makes its practical implementation very difficult for process characterization purposes. To minimize the execution time of this technique a dynamic mesh algorithm has been developed. Using this algorithm the decrease in the calculation time of the doping profile parameters of over one order of the magnitude was obtained. The improved computational method was verified using simulation examples and experimental results for ion implanted metal–oxide semiconductor capacitors.
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