Observation of a deep level inp‐type Hg0.78Cd0.22Te with high dislocation density
作者:
M. C. Chen,
R. A. Schiebel,
期刊:
Journal of Applied Physics
(AIP Available online 1992)
卷期:
Volume 71,
issue 10
页码: 5269-5271
ISSN:0021-8979
年代: 1992
DOI:10.1063/1.350590
出版商: AIP
数据来源: AIP
摘要:
To investigate the possibility that deep levels are associated with dislocations in narrow band gap HgCdTe, deep level transient spectroscopy has been used to studyn+‐pdiodes fabricated onp‐type bulk Hg0.78Cd0.22Te samples with either a ‘‘normal’’ dislocation density of about 105cm−2or a high dislocation density of about 106cm−2. These samples which are gold doped with a hole concentration of 1.2×1015cm−3, have a band gap of about 0.12 eV at 77 K. In samples with a ‘‘normal’’ dislocation density, a deep level of about 80 meV above the valence band was found. However, a midgap level of about 60 meV above the valence band with larger peak amplitude and broader line shapes was found in the sample with a high dislocation density.
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