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Role of Submicroscopic Projections in Electrical Breakdown

 

作者: H. E. Tomaschke,   D. Alpert,  

 

期刊: Journal of Vacuum Science and Technology  (AIP Available online 1967)
卷期: Volume 4, issue 4  

页码: 192-198

 

ISSN:0022-5355

 

年代: 1967

 

DOI:10.1116/1.1492545

 

出版商: American Vacuum Society

 

数据来源: AIP

 

摘要:

Observations with an electron microscope and with a modified field-emission microscope verify the formation of submicroscopic, whiskerlike projections on the cathode surface, thus lending additional supporting evidence for the association of electrical breakdown with field emission from such sites. Several mechanisms for the formation of whiskers are identified. The predischarge current, with which the initiation of breakdown is associated, is observed to exhibit large fluctuations in the presence of contamination on either or both electrodes, and a tentative explanation is set forth in terms of a special proliferation of small protuberances.

 

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