It is shown that the energy analysis of scattered electrons (EASE) is a useful tool when used in conjunction with the conventional LEED surface studies. It is demonstrated that the sensitivity is such that 0.02 monolayers of Cs can be detected on a Si surface. The Auger peak for K on a Ge(111) surface has been calibrated quantitatively and this calibration has been used to determine the K coverage after the overlayer was partially desorbed by heat treatments. The coverage measurements were used along with the LEED patterns to determine the surface structure.