High-resolution transmission electron micrographs of {1101} interfacial twin dislocations in Ti thin films, previously published in this journal, are re-examined. Computer simulations of the experimental images have been obtained using atomic models deduced by Pond, Bacon and Serra in 1995. Two twin dislocations were analysed, with step heights of4d(K1) and2d(K1), whered(K1) is the spacing of the {1101) planes. Reasonable agreement with the predicted structures is obtained at about 0.17nm resolution.