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SWITCHING AND LOW‐FIELD BREAKDOWN INn‐GaAs BULK DIODES

 

作者: John A. Copeland,  

 

期刊: Applied Physics Letters  (AIP Available online 1966)
卷期: Volume 9, issue 4  

页码: 140-142

 

ISSN:0003-6951

 

年代: 1966

 

DOI:10.1063/1.1754682

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Switching effects have been observed in the current vs voltage curves ofn‐type GaAs diodes with resistivities between 0.3 and 5 &OHgr;‐cm. After switching, the diodes go into a constant‐voltage avalanche breakdown state with a sustaining field of 4500 V/cm. These effects are attributed to a peak in the hole generation rate &agr; between 3,000 and 10,000 V/cm caused by high energy electrons in the (000) valley of the conduction band.

 

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