Wavelength dependence of short‐circuit current decay in solar cells
作者:
U. C. Ray,
S. K. Agarwal,
期刊:
Journal of Applied Physics
(AIP Available online 1988)
卷期:
Volume 63,
issue 2
页码: 547-549
ISSN:0021-8979
年代: 1988
DOI:10.1063/1.340084
出版商: AIP
数据来源: AIP
摘要:
The short‐circuit current decay technique has been used in the literature to determine the minority‐carrier lifetime in the base of solar cells. The dependence of the short‐circuit current decay on the wavelength of the excitation light is reported in detail. Both the theoretical expressions and experimental results are presented. The experimental results agree reasonably well with the theory.
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