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Zdependence of thick‐target &bgr;‐ray backscattering

 

作者: K. K. Sharma,   M. Singh,  

 

期刊: Journal of Applied Physics  (AIP Available online 1980)
卷期: Volume 51, issue 4  

页码: 2239-2241

 

ISSN:0021-8979

 

年代: 1980

 

DOI:10.1063/1.327848

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Variation of &bgr;‐ray backscattering with the atomic number of target material has been studied using thick targets of polythene, aluminum, iron, copper, zinc, tin, silver, tungsten, and lead for five &bgr; emitters, viz.,35S,147Pm,204Tl,32P, and90Sr‐90Y. Effects of geometry and &bgr;‐ray end‐point energy have been investigated using a reflection geometry in which the geometry factors were varied by more than 40 and &bgr;‐ray energy varied over a range 0.167–2.27 MeV. It is found that the mean value of the index ofZdependence of &bgr;‐ray backscattering is 1.840.05 over these regions of geometry and energy. Deviations for soft &bgr; emitters have been confirmed as due to air absorption. The importance of these results in studies of two‐component systems is emphasized.

 

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