Enhanced diffusion mechanisms
作者:
J.C. Bourgoin,
J.W. Corbett,
期刊:
Radiation Effects
(Taylor Available online 1978)
卷期:
Volume 36,
issue 3-4
页码: 157-188
ISSN:0033-7579
年代: 1978
DOI:10.1080/00337577808240846
出版商: Taylor & Francis Group
数据来源: Taylor
摘要:
The phenomenology is reviewed for several enhanced diffusion mechanisms: the normal ionization-enhanced diffusion mechanism, the Bourgoin mechanism, the energy-release mechanism and some recoil mechanisms. Application of these mechanisms are discussed for crystalline and amorphous semiconductors, super-ionic materials and insulators in radiation damage, impurity and self-diffusion, ion-implantation, and dislocation-motion-experiments.
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