Three‐dimensional atom probe analysis of a sputter‐deposited Co–Cr thin film
作者:
K. Hono,
K. Yeh,
Y. Maeda,
T. Sakurai,
期刊:
Applied Physics Letters
(AIP Available online 1995)
卷期:
Volume 66,
issue 13
页码: 1686-1688
ISSN:0003-6951
年代: 1995
DOI:10.1063/1.113893
出版商: AIP
数据来源: AIP
摘要:
Three‐dimensional atom probe (3DAP) was employed to study nanoscale compositional heterogeneities in Co‐22 at. %Cr sputter‐deposited thin films. Compositional fluctuations were visualized on a nanometer scale through a 3D reconstruction of collected atoms. Transmission electron microscopy observations of the same specimen area of before and after 3DAP analysis made it possible to scale the analyzed volume precisely. The resulting data show that a Co‐22 at. %Cr thin film sputter deposited at elevated temperature was composed of two phases with a lamellarlike structure, one phase was ferromagnetic containing approximately 90 at. %Co, and the other was paramagnetic, containing approximately 60 at. %Co. ©1995 American Institute of Physics.
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