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1/fnoise in Hall effect: Fluctuations in mobility

 

作者: T. G. M. Kleinpenning,  

 

期刊: Journal of Applied Physics  （AIP Available online 1980）
卷期: Volume 51, issue 6  

页码: 3438-3438

 

ISSN:0021-8979

 

年代: 1980

 

DOI:10.1063/1.328029

 

出版商: AIP

 

数据来源: AIP

 

摘要:

From theoretical and experimental investigations on 1/fnoise in the Hall voltage at high magnetic induction it is concluded that 1/fnoise is caused by mobility fluctuations.

 

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