Atomic force microscopy (AFM) was used to image the surface of SrF2(111) with resolution of individual fluorine ions. A SrF2single crystal was cleaved along the (111) plane and imaged under 0.01 M HCl solution to remove contaminants. In some areas the hexagonal arrangement of the ions is clearly visible with interionic spacings of 3.96 Å, which is in good agreement with the crystallographical data. Studies of the epitaxial growth of alkaline earth fluorides on semiconductors may now be possible with AFM.