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Superconducting properties, electrical resistivities, and structure of NbN thin films

 

作者: Y. M. Shy,   L. E. Toth,   R. Somasundaram,  

 

期刊: Journal of Applied Physics  (AIP Available online 1973)
卷期: Volume 44, issue 12  

页码: 5539-5545

 

ISSN:0021-8979

 

年代: 1973

 

DOI:10.1063/1.1662193

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Superconducting properties and electrical resistivities of NbN thin films have been studied as a function of sputtering parameters, film structure, and composition. A good correlation exists between superconductingTc's and film structure and composition regardless of the sputtering conditions used to achieve this structure. The most important parameters affectingTcare lattice parameter, crystal structure, island structure, and impurity content. Substrate temperature, Ar/N2ratio, and impurity content are the principal sputtering parameters affecting film structure, and thusTc.

 

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