Modification of surface morphology and optoelectronic response in porous Si films by electrochemical methods
作者:
Zhong-Hua Yang,
Peng Zhang,
De-Jun Wang,
Tie-Jin Li,
期刊:
Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
(AIP Available online 1997)
卷期:
Volume 15,
issue 5
页码: 1604-1606
ISSN:1071-1023
年代: 1997
DOI:10.1116/1.589555
出版商: American Vacuum Society
关键词: Si
数据来源: AIP
摘要:
The effect of variedH+concentration on surface morphology of porous silicon (PS) is observed by atomic force microscopy technique. A new mechanism of PS formation concerningH+effect is proposed. The photoluminescence (PL) spectra of two typical PS samples have different responses in the short-wavelength region. Surface photovoltage spectra results imply that the short-wavelength PL band of the PS sample prepared in highH+concentration may be related to direct band-gap transition.
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