Magneto‐optical methods involving only strip domain patterns are proposed for the measurement of characteristic lengthl, saturation magnetization 4&pgr;Ms, and domain wall energy density &sgr;w, in thin uniaxial magnetic films. Determination oflrequires measurement of film thickness and the spatial period of the strip domain pattern in zero applied field as previously proposed by Fowlis and Copeland, while 4&pgr;Msand &sgr;wfollow from additional measurements ofM/MsvsHas a hysteresis loop. The results of calculations which are necessary to put the methods to use are presented in detail. Experimental results are included which indicate reasonable agreement with other methods currently in use. The present method is of greater accuracy and convenience in certain cases. The effects of finite uniaxial anisotropy are quantitatively considered and shown to change the results by 6% or less for materials of practical interest.