High resolution x-ray diffraction studies of short-period CdTe/MnTe superlattices
作者:
M. de Naurois,
J. Stangl,
W. Faschinger,
G. Bauer,
S. Ferriera,
期刊:
Journal of Applied Physics
(AIP Available online 1997)
卷期:
Volume 81,
issue 9
页码: 6120-6125
ISSN:0021-8979
年代: 1997
DOI:10.1063/1.364392
出版商: AIP
数据来源: AIP
摘要:
We have investigated the elastic properties of epitaxial MnTe layers using triple axis high resolution x-ray diffraction and reciprocal space mapping. A series CdTe/MnTe superlattices (SLs) grown by molecular beam epitaxy and nearly strain compensated, were deposited on [001]Cd1−xZnxTesubstrates. In order to obtain the MnTe content of these SLs without ana prioriknowledge of the elastic properties of cubic MnTe, annealing experiments were performed to interdiffuse the individual layers into a mixedCd1−xMnx Tealloy layer. For a precise analysis of the data, it was found to be important to determine the in-plane strain of the superlattice layers using reciprocal space maps around symmetric and asymmetric reciprocal lattice points. The value for the Poisson ratio of zinc-blende MnTe was determined to be&ngr;=C11/2C12=0.77±0.15.©1997 American Institute of Physics.
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