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Analysis of a photographic–vidicon camera method of LEED intensity measurements

 

作者: T. N. Tommet,   G. B. Olszewski,   P. A. Chadwick,   S. L. Bernasek,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1979)
卷期: Volume 50, issue 2  

页码: 147-156

 

ISSN:0034-6748

 

年代: 1979

 

DOI:10.1063/1.1135796

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Low‐energy electron diffraction (LEED) has great need for a quick and efficient means of making intensity measurements (e.g., in studying reactive surfaces which quickly degrade, and in handling the enormous amounts of data needed for data averaging). The photographic–vidicon camera method fills this need. This paper describes a system and procedure for this method. We have pointed out advantages of this method over other methods of LEED intensity data collection and analysis, and have included comments on the advantages of our experimental system over other systems using this method. General properties of the photographic and vicdicon system are analyzed as well as specific tests done on the method. Estimates of probable error in spot intensity measurements due to numerous effects have been analyzed and I–V curves reduced from raw photographic data are compared. It is hoped that the description, comments, and analysis will facilitate the incorporation of the photographic–vidicon method of LEED analysis into research programs.

 

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