Analysis of a photographic–vidicon camera method of LEED intensity measurements
作者:
T. N. Tommet,
G. B. Olszewski,
P. A. Chadwick,
S. L. Bernasek,
期刊:
Review of Scientific Instruments
(AIP Available online 1979)
卷期:
Volume 50,
issue 2
页码: 147-156
ISSN:0034-6748
年代: 1979
DOI:10.1063/1.1135796
出版商: AIP
数据来源: AIP
摘要:
Low‐energy electron diffraction (LEED) has great need for a quick and efficient means of making intensity measurements (e.g., in studying reactive surfaces which quickly degrade, and in handling the enormous amounts of data needed for data averaging). The photographic–vidicon camera method fills this need. This paper describes a system and procedure for this method. We have pointed out advantages of this method over other methods of LEED intensity data collection and analysis, and have included comments on the advantages of our experimental system over other systems using this method. General properties of the photographic and vicdicon system are analyzed as well as specific tests done on the method. Estimates of probable error in spot intensity measurements due to numerous effects have been analyzed and I–V curves reduced from raw photographic data are compared. It is hoped that the description, comments, and analysis will facilitate the incorporation of the photographic–vidicon method of LEED analysis into research programs.
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