An Effective Sampling Plan (ESP) which assumes a gamma prior distribution on the lot percent defective is developed. The sample size and acceptance number are selected using estimates of the parameters of the gamma prior distribution. A set of ESP's is generated from an initial plan selected from MIL-STD-105D. Process control procedures are given with decision rules for moving from plan to plan within the set. All plans of the ESP set have the same Bayesian OC curve as the initial plan and provide for reduced sampling with improvement in the process.