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Origins and effects of thermal processes on near‐field optical probes

 

作者: A. H. La Rosa,   B. I. Yakobson,   H. D. Hallen,  

 

期刊: Applied Physics Letters  (AIP Available online 1995)
卷期: Volume 67, issue 18  

页码: 2597-2599

 

ISSN:0003-6951

 

年代: 1995

 

DOI:10.1063/1.115143

 

出版商: AIP

 

数据来源: AIP

 

摘要:

An aluminum‐coated tapered fiber probe, as used in near‐field scanning optical microscopy (NSOM), is heated by the light coupled into it. This can destroy the probe or may modify the sample, which can be problematic or used as a tool. To study these thermal effects, we couple modulated visible light of various power through probes. Simultaneously coupled infrared light senses the thermal effects. We report their magnitude, their spatial and temporal scales, and real‐time probe damage observations. A model describes the experimental data, the mechanisms for induced IR variation, and their relative importance. ©1995 American Institute of Physics.

 

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