A capacitance method for measurement of film thickness in two‐phase flow
作者:
Mustafa R. O¨zgu¨,
John C. Chen,
Nikolai Eberhardt,
期刊:
Review of Scientific Instruments
(AIP Available online 1973)
卷期:
Volume 44,
issue 12
页码: 1714-1716
ISSN:0034-6748
年代: 1973
DOI:10.1063/1.1686039
出版商: AIP
数据来源: AIP
摘要:
A new capacitance method is described for the measurement of local, time‐varying or steady‐state film thickness in two‐phase flow studies. The method is suitable for use in simple and complex geometries, and works for either electrically nonconducting or slightly conducting fluids. Test data were obtained on bubbles of different lengths rising in a circular tube filled with water. Results for film thicknesses and bubble residence times showed good self‐consistency and agreement with other available data.
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