Application of Fluorescence X‐Rays to Metallurgical Microradiography
作者:
H. R. Splettstosser,
H. E. Seemann,
期刊:
Journal of Applied Physics
(AIP Available online 1952)
卷期:
Volume 23,
issue 11
页码: 1217-1222
ISSN:0021-8979
年代: 1952
DOI:10.1063/1.1702035
出版商: AIP
数据来源: AIP
摘要:
Fluorescence x‐rays may be more useful analytically in metallurgical microradiography than the line emission from a tube target because of the greater homogeneity of the former radiation. Although the intensity of fluorescence is very low, exposure times are not prohibitive for some applications. In the present report, the method and apparatus are described and illustrative examples are shown.
点击下载:
PDF
(801KB)
返 回