首页   按字顺浏览 期刊浏览 卷期浏览 Application of Fluorescence X‐Rays to Metallurgical Microradiography
Application of Fluorescence X‐Rays to Metallurgical Microradiography

 

作者: H. R. Splettstosser,   H. E. Seemann,  

 

期刊: Journal of Applied Physics  (AIP Available online 1952)
卷期: Volume 23, issue 11  

页码: 1217-1222

 

ISSN:0021-8979

 

年代: 1952

 

DOI:10.1063/1.1702035

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Fluorescence x‐rays may be more useful analytically in metallurgical microradiography than the line emission from a tube target because of the greater homogeneity of the former radiation. Although the intensity of fluorescence is very low, exposure times are not prohibitive for some applications. In the present report, the method and apparatus are described and illustrative examples are shown.

 

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