Precision Measurement of the Cleavage Plane Grating Spacing of Potassium Acid Phthalate
作者:
Alan J. Bearden,
F. N. Huffman,
期刊:
Review of Scientific Instruments
(AIP Available online 1963)
卷期:
Volume 34,
issue 11
页码: 1233-1234
ISSN:0034-6748
年代: 1963
DOI:10.1063/1.1718187
出版商: AIP
数据来源: AIP
摘要:
The clevage plane grating spacing of potassium acid phthalate (KAP) has been measured in nine orders of diffraction andd∞found to be (13289.51±0.05 xu) at 26°C. The use of these crystals as diffraction elements for the wavelength range 6 to 25 Å is discussed. Measurement of the lattice spacing is by diffraction angle determinations in many orders with Cu K&agr;1radiation. An angular precision of 0.1″ is attained. The index of refraction was calculated from the crystal constants and is consistent with the observed orders of diffraction.
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