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Precision Measurement of the Cleavage Plane Grating Spacing of Potassium Acid Phthalate

 

作者: Alan J. Bearden,   F. N. Huffman,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1963)
卷期: Volume 34, issue 11  

页码: 1233-1234

 

ISSN:0034-6748

 

年代: 1963

 

DOI:10.1063/1.1718187

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The clevage plane grating spacing of potassium acid phthalate (KAP) has been measured in nine orders of diffraction andd∞found to be (13289.51±0.05 xu) at 26°C. The use of these crystals as diffraction elements for the wavelength range 6 to 25 Å is discussed. Measurement of the lattice spacing is by diffraction angle determinations in many orders with Cu K&agr;1radiation. An angular precision of 0.1″ is attained. The index of refraction was calculated from the crystal constants and is consistent with the observed orders of diffraction.

 

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