Fast, sensitive laser deflection system suitable for transient plasma analysis
作者:
C. L. Enloe,
R. M. Gilgenbach,
J. S. Meachum,
期刊:
Review of Scientific Instruments
(AIP Available online 1987)
卷期:
Volume 58,
issue 9
页码: 1597-1600
ISSN:0034-6748
年代: 1987
DOI:10.1063/1.1139407
出版商: AIP
数据来源: AIP
摘要:
A laser deflection measurement system has been developed which is both fast (&tgr;≊20 ns) and sensitive (&dgr;&fgr;≊0.5 &mgr;rad). This diagnostic is capable of sensing and discriminating between electrons and neutral particles in a multicomponent plasma, and yields quantitative results. The technique allows continuous measurements in time. Construction is inexpensive and simple to field. This system is, therefore, highly competitive with traditional techniques in diagnosing the development of transient plasmas.
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