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Fast, sensitive laser deflection system suitable for transient plasma analysis

 

作者: C. L. Enloe,   R. M. Gilgenbach,   J. S. Meachum,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1987)
卷期: Volume 58, issue 9  

页码: 1597-1600

 

ISSN:0034-6748

 

年代: 1987

 

DOI:10.1063/1.1139407

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A laser deflection measurement system has been developed which is both fast (&tgr;≊20 ns) and sensitive (&dgr;&fgr;≊0.5 &mgr;rad). This diagnostic is capable of sensing and discriminating between electrons and neutral particles in a multicomponent plasma, and yields quantitative results. The technique allows continuous measurements in time. Construction is inexpensive and simple to field. This system is, therefore, highly competitive with traditional techniques in diagnosing the development of transient plasmas.

 

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